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Signal Integrity Analysis at Extreme Data Rates - a White Paper written for Anritsu, 2010.
(Winner of the 2010 DesignCon Best Paper Award) A new Technique for Stessed Receiver Tolerance Testing Using Crest Factor Emulation, with John Calvin, DesignCon 2010.
Analysis of Random Noise and the Effect of Band-Limited Noise on Stressed-Eye Receiver Tolerance Tests - with Marcus Mueller, DesignCon 2009.
Three Part Knowledge Series sponsored by Tektronix Instruments
“Answering Next-Gen Serial Challenges”
Part One: How Stressing a Receiver Removes Stress from a Designer
Part Two: The Case of the Closing Eye
Part Three Acting on an Impulse: Equalization and Emphasis
Characterization of Gaussian Noise Sources - with Bob Muro, NoiseCom, DesignCon 2008.
The Future of Multi-Clock Systems - with Roman Boroditsky and Juan Gomez of NEL, DesignCon2008; also available as a White Paper for NEL Frequency Controls, Inc., 2007.
Using Clock Jitter Analysis to Reduce BER in Serial Data Applications - an Application Note written without a byline for Agilent Technologies, 2006.
Anticipating, Characterizing, and Avoiding Problems with Crosstalk - presented at DesignCon in 2006.
Equalization: The Correction and Analysis of Degraded Signals - a white paper written with a byline for Agilent Technologies. See also, Opening Closed Eyes: Analysis and Equalization of High Data Rate Signals on Buses and Backplanes - presented at DesignCon2006.
“Jitter 260”Six Part Knowledge Series sponsored by Tektronix Instruments
Part One: The Meaning of Total Jitter
Part Two: What the Dual-Dirac Model is and What it is Not
Part three: All About the Acronyms: RJ, DJ, DDJ, ISI, DCD, ...
Part Four: Jitter Analysis in Systems with Crosstalk
Part Five: Clock Recovery in Serial-Data Systems
Part Six: Reference Clock Jitter and Data Jitter
The Rules of Jitter Analysis - published in the online trade magazine, AnalogZone for Agilent Technologies.
Jitter Analysis: The dual-Dirac model, RJ/DJ, and Q-scale - a white paper for Agilent Technologies that is the paper most frequently referenced on dual-Dirac and Q-scale by standards groups and other authors.
Jitterfest: Why Different Jitter Analyzers Give Different Results and Which is Right - published in the online trade magazine, AnalogZone. See also, Comparison of Different Jitter Analysis Techniques with a Precision Jitter Transmitter - white paper describing the results of the study led by Ransom for Agilent Technologies to determine the accuracy of different jitter analysis methods; and Jitter Analysis: What Works, What Doesn’t, and Why - a web-seminar presented live that set and attendance record for Agilent Technologies with over 600 viewers when delivered live and a total of over 2000 viewers including the archived broadcast.
Analyzing Jitter at High Data Rates - published in IEEE Optical Communications.
Measurement of Total Jitter at Low Probability Levels Using the Optimized BERT Scan Method - with Marcus Mueller and Russ McHugh of Agilent Technologies - this paper presented a new technique invented by Ransom that reduced test time by a factor of ten with improved accuracy and won a DesignCon paper award.
Precision Jitter Transmitter - an application note written with Jim Stimple of Agilent Technologies, documents the most accurate jitter transmitter every made - developed in a project conceived and led by Ransom.
Back to Basics in Optical Technology - a day-long seminar created by Ransom and delivered coast-to-coast at the sites of Agilent Technologies’ customers.
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